Kang, M.; Kim, N.; Nam, H.; Lee, Y.-S.; Lee, H.-J.; Kang, T.Y.
Crack Diagnosis of Surface-Mount Capacitors Using AI Classification Models with Multi-Parameter Impedance Spectra. Electronics 2025, 14, 4293.
https://doi.org/10.3390/electronics14214293
AMA Style
Kang M, Kim N, Nam H, Lee Y-S, Lee H-J, Kang TY.
Crack Diagnosis of Surface-Mount Capacitors Using AI Classification Models with Multi-Parameter Impedance Spectra. Electronics. 2025; 14(21):4293.
https://doi.org/10.3390/electronics14214293
Chicago/Turabian Style
Kang, Minkyu, Namgyeong Kim, Hyunwoo Nam, Yong-Seok Lee, Hak-Jun Lee, and Tae Yeob Kang.
2025. "Crack Diagnosis of Surface-Mount Capacitors Using AI Classification Models with Multi-Parameter Impedance Spectra" Electronics 14, no. 21: 4293.
https://doi.org/10.3390/electronics14214293
APA Style
Kang, M., Kim, N., Nam, H., Lee, Y.-S., Lee, H.-J., & Kang, T. Y.
(2025). Crack Diagnosis of Surface-Mount Capacitors Using AI Classification Models with Multi-Parameter Impedance Spectra. Electronics, 14(21), 4293.
https://doi.org/10.3390/electronics14214293