Zhang, J.; Liu, Z.; Hu, X.; Liu, P.; Hu, Z.; Kuang, L.
FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs. Electronics 2024, 13, 1667.
https://doi.org/10.3390/electronics13091667
AMA Style
Zhang J, Liu Z, Hu X, Liu P, Hu Z, Kuang L.
FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs. Electronics. 2024; 13(9):1667.
https://doi.org/10.3390/electronics13091667
Chicago/Turabian Style
Zhang, Jin, Zhenghui Liu, Xiao Hu, Peixin Liu, Zhiling Hu, and Lidan Kuang.
2024. "FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs" Electronics 13, no. 9: 1667.
https://doi.org/10.3390/electronics13091667
APA Style
Zhang, J., Liu, Z., Hu, X., Liu, P., Hu, Z., & Kuang, L.
(2024). FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs. Electronics, 13(9), 1667.
https://doi.org/10.3390/electronics13091667