Article Versions Notes

Picos R, Stavrinides SG, Al Chawa MM, de Benito C, Dueñas S, Castan H, Hatzikraniotis E, Chua LO. Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics. 2022; 11(11):1672. https://doi.org/10.3390/electronics11111672

Picos, Rodrigo, Stavros G. Stavrinides, Mohamad Moner Al Chawa, Carola de Benito, Salvador Dueñas, Helena Castan, Euripides Hatzikraniotis, and Leon O. Chua. 2022. "Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map" Electronics 11, no. 11: 1672. https://doi.org/10.3390/electronics11111672

Picos, R., Stavrinides, S. G., Al Chawa, M. M., de Benito, C., Dueñas, S., Castan, H., Hatzikraniotis, E., & Chua, L. O. (2022). Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics, 11(11), 1672. https://doi.org/10.3390/electronics11111672