Picos, R.; Stavrinides, S.G.; Al Chawa, M.M.; de Benito, C.; Dueñas, S.; Castan, H.; Hatzikraniotis, E.; Chua, L.O.
Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics 2022, 11, 1672.
https://doi.org/10.3390/electronics11111672
AMA Style
Picos R, Stavrinides SG, Al Chawa MM, de Benito C, Dueñas S, Castan H, Hatzikraniotis E, Chua LO.
Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics. 2022; 11(11):1672.
https://doi.org/10.3390/electronics11111672
Chicago/Turabian Style
Picos, Rodrigo, Stavros G. Stavrinides, Mohamad Moner Al Chawa, Carola de Benito, Salvador Dueñas, Helena Castan, Euripides Hatzikraniotis, and Leon O. Chua.
2022. "Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map" Electronics 11, no. 11: 1672.
https://doi.org/10.3390/electronics11111672
APA Style
Picos, R., Stavrinides, S. G., Al Chawa, M. M., de Benito, C., Dueñas, S., Castan, H., Hatzikraniotis, E., & Chua, L. O.
(2022). Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics, 11(11), 1672.
https://doi.org/10.3390/electronics11111672