Journal of Low Power Electronics and Applications, Volume 1, Issue 3

Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this pap...

While Moore’s law scaling continues to double transistor density every technology generation, new design challenges are introduced. One of these challenges is variation, resulting in deviations in the behavior of transistors, most importantly in swit...