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Low Power Testing—What Can Commercial Design-for-Test Tools Provide?

Mentor Graphics Corp./8005 SW Boeckman Rd., Wilsonville, OR 97070, USA
J. Low Power Electron. Appl. 2011, 1(3), 357-372; https://doi.org/10.3390/jlpea1030357
Received: 16 August 2011 / Revised: 2 December 2011 / Accepted: 5 December 2011 / Published: 9 December 2011
(This article belongs to the Special Issue Industrial Aspects of Low Power Design Recent Trends and Methods)
Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this paper describes how DFT tools can help to achieve comprehensive testing of low power designs and reduce test power consumption during test application. View Full-Text
Keywords: low-power design; low-power testing; scan testing; test compression; DFT tools low-power design; low-power testing; scan testing; test compression; DFT tools
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Lin, X. Low Power Testing—What Can Commercial Design-for-Test Tools Provide? J. Low Power Electron. Appl. 2011, 1, 357-372.

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