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Open AccessArticle

Infrared Polariscopy Imaging of Linear Polymeric Patterns with a Focal Plane Array

1
Tokyo Institute of Technology, Meguro-ku, Tokyo 152-8550, Japan
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Swinburne University of Technology, John Street, Hawthorn, Victoria 3122, Australia
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Research Institute of Electronics, Shizuoka University, Naka-ku, 3-5-3-1 Johoku, Hamamatsu, Shizuoka 4328561, Japan
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Infrared Microspectroscopy Beamline, Australian Synchrotron, Clayton, Victoria 3168, Australia
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THz-Far Infrared Beamline, Australian Synchrotron, Clayton, Victoria 3168, Australia
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Institute for Frontier Materials, Deakin University, Geelong, Victoria 3220, Australia
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Tokyo Tech World Research Hub Initiative (WRHI), School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550, Japan
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Melbourne Center for Nanofabrication, Australian National Fabrication Facility, Clayton, Victoria 3168, Australia
*
Authors to whom correspondence should be addressed.
Nanomaterials 2019, 9(5), 732; https://doi.org/10.3390/nano9050732
Received: 21 April 2019 / Revised: 4 May 2019 / Accepted: 4 May 2019 / Published: 13 May 2019
Polariscopy is demonstrated using hyperspectral imaging with a focal plane array (FPA) detector in the infrared (IR) spectral region under illumination by thermal and synchrotron light sources. FPA Fourier-transform IR (FTIR) imaging microspectroscopy is useful for monitoring real time changes at specific absorption bands when combined with a high brightness synchrotron source. In this study, several types of samples with unique structural motifs were selected and used for assessing the capability of polariscopy under this FPA-FTIR imaging technique. It was shown that the time required for polariscopy at IR wavelengths can be substantially reduced by the FPA-FTIR imaging approach. By using natural and laser fabricated polymers with sub-wavelength features, alignment of absorbing molecular dipoles and higher order patterns (laser fabricated structures) were revealed. Spectral polariscopy at the absorption peaks can reveal the orientation of sub-wavelength patterns (even when they are not spatially resolved) or the orientation of the absorbing dipoles. View Full-Text
Keywords: focal plane array; thermal source; synchrotron radiation; infrared spectroscopy; hyperspectral imaging; silk focal plane array; thermal source; synchrotron radiation; infrared spectroscopy; hyperspectral imaging; silk
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MDPI and ACS Style

Honda, R.; Ryu, M.; Moritake, M.; Balčytis, A.; Mizeikis, V.; Vongsvivut, J.; Tobin, M.J.; Appadoo, D.; Li, J.-L.; Ng, S.H.; Juodkazis, S.; Morikawa, J. Infrared Polariscopy Imaging of Linear Polymeric Patterns with a Focal Plane Array. Nanomaterials 2019, 9, 732.

AMA Style

Honda R, Ryu M, Moritake M, Balčytis A, Mizeikis V, Vongsvivut J, Tobin MJ, Appadoo D, Li J-L, Ng SH, Juodkazis S, Morikawa J. Infrared Polariscopy Imaging of Linear Polymeric Patterns with a Focal Plane Array. Nanomaterials. 2019; 9(5):732.

Chicago/Turabian Style

Honda, Reo; Ryu, Meguya; Moritake, Masayuki; Balčytis, Armandas; Mizeikis, Vygantas; Vongsvivut, Jitraporn; Tobin, Mark J.; Appadoo, Dominique; Li, Jing-Liang; Ng, Soon H.; Juodkazis, Saulius; Morikawa, Junko. 2019. "Infrared Polariscopy Imaging of Linear Polymeric Patterns with a Focal Plane Array" Nanomaterials 9, no. 5: 732.

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