Liu, M.; Sun, Z.; Lu, H.; Shen, C.; Zhang, L.; Wang, R.; Huang, R.
A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs. Nanomaterials 2023, 13, 1507.
https://doi.org/10.3390/nano13091507
AMA Style
Liu M, Sun Z, Lu H, Shen C, Zhang L, Wang R, Huang R.
A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs. Nanomaterials. 2023; 13(9):1507.
https://doi.org/10.3390/nano13091507
Chicago/Turabian Style
Liu, Minghao, Zixuan Sun, Haoran Lu, Cong Shen, Lining Zhang, Runsheng Wang, and Ru Huang.
2023. "A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs" Nanomaterials 13, no. 9: 1507.
https://doi.org/10.3390/nano13091507
APA Style
Liu, M., Sun, Z., Lu, H., Shen, C., Zhang, L., Wang, R., & Huang, R.
(2023). A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs. Nanomaterials, 13(9), 1507.
https://doi.org/10.3390/nano13091507