Next Article in Journal
Adsorption Characteristics of Pristine and Magnetic Olive Stones Biochar with Respect to Clofazimine
Previous Article in Journal
Development of a Novel Multifunctional Cementitious-Based Geocomposite by the Contribution of CNT and GNP
Previous Article in Special Issue
Sulpho-Salicylic Acid Grafted to Ferrite Nanoparticles for n-Type Organic Semiconductors
Article

Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure

1
Institute of Macromolecular Chemistry of the Czech Academy of Sciences, Heyrovsky Sq. 2, 162 06 Prague 6, Czech Republic
2
Institute of Scientific Instruments of the Czech Academy of Sciences, Kralovopolska 147, 612 64 Brno, Czech Republic
*
Authors to whom correspondence should be addressed.
Academic Editor: Bogdan Stefan Vasile
Nanomaterials 2021, 11(4), 962; https://doi.org/10.3390/nano11040962
Received: 20 March 2021 / Revised: 31 March 2021 / Accepted: 6 April 2021 / Published: 9 April 2021
(This article belongs to the Special Issue Microscopy of nanomaterials)
We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array). Nevertheless, the individual 4D-STEM diffractograms are difficult to analyze due to the random orientation of nanocrystalline material. In our method, all individual diffractograms (showing randomly oriented diffraction spots from a few nanocrystals) are combined into one composite diffraction pattern (showing diffraction rings typical of polycrystalline/powder materials). The final powder diffraction pattern can be analyzed by means of standard programs for TEM/SAED (Selected-Area Electron Diffraction). We called our new method 4D-STEM/PNBD (Powder NanoBeam Diffraction) and applied it to three different systems: Au nano-islands (well diffracting nanocrystals with size ~20 nm), small TbF3 nanocrystals (size < 5 nm), and large NaYF4 nanocrystals (size > 100 nm). In all three cases, the STEM/PNBD results were comparable to those obtained from TEM/SAED. Therefore, the 4D-STEM/PNBD method enables fast and simple analysis of nanocrystalline materials, which opens quite new possibilities in the field of SEM. View Full-Text
Keywords: nanoparticle analysis; powder nanobeam electron diffraction; 4D-STEM/PNBD nanoparticle analysis; powder nanobeam electron diffraction; 4D-STEM/PNBD
Show Figures

Figure 1

MDPI and ACS Style

Slouf, M.; Skoupy, R.; Pavlova, E.; Krzyzanek, V. Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure. Nanomaterials 2021, 11, 962. https://doi.org/10.3390/nano11040962

AMA Style

Slouf M, Skoupy R, Pavlova E, Krzyzanek V. Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure. Nanomaterials. 2021; 11(4):962. https://doi.org/10.3390/nano11040962

Chicago/Turabian Style

Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. 2021. "Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure" Nanomaterials 11, no. 4: 962. https://doi.org/10.3390/nano11040962

Find Other Styles
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop