Special Issue "Microscopy of nanomaterials"

A special issue of Nanomaterials (ISSN 2079-4991).

Deadline for manuscript submissions: 21 March 2021.

Special Issue Editor

Dr. Bogdan Stefan Vasile
Guest Editor
National Research Center for Micro and Nanomaterials, Department of Science and Engineering of Oxide Materials and Nanomaterials, Faculty of Applied Chemistry and Materials Science, POLITEHNICA University of Bucharest, Bucharest, 011061, Romania
Interests: binders materials science; cement physical and chemical characterization techniques; end-of-life materials; waste management; high-resolution transmission electron microscopy; analytical TEM (EELS, EDX)
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Special Issue Information

Dear Colleagues,

Because electron microscopy is a high-end technique to characterize nanomaterials, I believe that special attention must be taken in this field. Both high-resolution scanning electron microscopy and transmission electron microscopy, as well as any microscopy technique (such as AFM, correlative microscopy, light microscopy, super resolution imaging, etc.), are indispensable techniques for characterising nanomaterials, either in the life science field or in the materials science field. The main objective of this Special Issue is to extend the knowledge and highlight the importance of microscopy techniques in developing and characterising various nanostructures such as nanoparticles, nanowires, and thin films, and their interactions with different materials. The domains in which microscopy techniques will be used are both in life and materials science with applications from biomedical devices, drug delivery systems, medical imaging to multiferoic materials, high-energy batteries, capacitors, superconductors, and aerospace components. The main point to keep in mind for this Special Issue of Nanomaterials is that it will attempt to cover the usage of microscopy techniques as the main tool to investigate recent advances in the synthesis, processing, and application of nanostructured materials.

Dr. Bogdan Stefan Vasile
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • Life science microscopy
  • Interactions in living tissues and cells
  • Super-resolution and light microscopy
  • Applications of the AFM and related techniques of organic and biological compounds on different substrates
  • Exploring 3D microscopy in cells and tissue imaging
  • Correlative microscopy of biological samples: fluorescence imaging, electron microscopy, cryo-EM, volume EM, micro-CT, soft X-ray, AFM, etc.
  • Biomolecular labelling
  • Volume Scanning Electron Microscopy
  • Cryo-Electron Tomography
  • Image processing in Electron Microscopy
  • Materials Science Microscopy
  • Electron Microscopy of 1D and 2D materials
  • Microscopy in Industrial Applications
  • Phase Microscopy
  • Spectroscopy in Electron Microscopy
  • Electron diffraction and structural analysis
  • In situ TEM and high-resolution TEM
  • Scanning Transmission Electron Microscopy
  • Analytical STEM
  • Applications of the AFM and related techniques in materials science. This includes also PFM, MFM, and STM
  • Electron tomography

Published Papers

This special issue is now open for submission.
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