Efanov, D.V.; Pogodina, T.S.; Aripov, N.M.; Boltayev, S.T.; Azizov, A.R.; Ametova, E.K.; Shakirova, F.F.
Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions. Computation 2025, 13, 15.
https://doi.org/10.3390/computation13010015
AMA Style
Efanov DV, Pogodina TS, Aripov NM, Boltayev ST, Azizov AR, Ametova EK, Shakirova FF.
Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions. Computation. 2025; 13(1):15.
https://doi.org/10.3390/computation13010015
Chicago/Turabian Style
Efanov, Dmitry V., Tatiana S. Pogodina, Nazirjan M. Aripov, Sunnatillo T. Boltayev, Asadulla R. Azizov, Elnara K. Ametova, and Feruza F. Shakirova.
2025. "Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions" Computation 13, no. 1: 15.
https://doi.org/10.3390/computation13010015
APA Style
Efanov, D. V., Pogodina, T. S., Aripov, N. M., Boltayev, S. T., Azizov, A. R., Ametova, E. K., & Shakirova, F. F.
(2025). Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions. Computation, 13(1), 15.
https://doi.org/10.3390/computation13010015