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An Approach to Reduce Greenhouse Gases in the Semiconductor Industry Using F2 Dissociated in Plasma for CVD Chamber Cleaning

1
Fraunhofer EMFT, Research Institution for Microsystems and Solid State Technologies Munich, 80686 Muenchen, Germany
2
Institute of Electronic and Sensor Materials, Technische Universität Bergakademie Freiberg, 09599 Freiberg, Germany
3
Solvay Fluor GmbH, 30173 Hannover, Germany
*
Author to whom correspondence should be addressed.
Appl. Sci. 2018, 8(6), 846; https://doi.org/10.3390/app8060846
Received: 17 April 2018 / Revised: 5 May 2018 / Accepted: 7 May 2018 / Published: 23 May 2018
(This article belongs to the Section Chemistry)
The gases used in industrial cleaning processes are considered greenhouse gases with a high global warming potential (GWP). It is important to provide a viable alternative chemical vapor deposition (CVD) cleaning gas that is capable of removing efficiently deposited layers on the CVD chamber inner wall and other parts of the apparatus. The cleaning gas has to be environmental friendly in order to avoid accentuation of the global warming phenomena. Besides that, the alternative cleaning gas should be compatible with the existing gas delivery system and the CVD equipment that is already used by industrial companies. Only by fulfilling the three requirements mentioned above is it possible to replace the well-established cleaning gases. In this project, an F2–gas mixture for the in-situ cleaning of CVD chambers has been studied and compared with conventional cleaning methods. The conventional cleaning process is defined as a cleaning procedure using either C2F6 in RF plasma discharge or NF3 in remote plasma discharge. View Full-Text
Keywords: F2-gas mixture; global warming potential; CVD chamber cleaning; remote plasma source; NF3; C2F6 F2-gas mixture; global warming potential; CVD chamber cleaning; remote plasma source; NF3; C2F6
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MDPI and ACS Style

Boudaden, J.; Altmannshofer, S.; Wieland, R.; Pittroff, M.; Eisele, I. An Approach to Reduce Greenhouse Gases in the Semiconductor Industry Using F2 Dissociated in Plasma for CVD Chamber Cleaning. Appl. Sci. 2018, 8, 846. https://doi.org/10.3390/app8060846

AMA Style

Boudaden J, Altmannshofer S, Wieland R, Pittroff M, Eisele I. An Approach to Reduce Greenhouse Gases in the Semiconductor Industry Using F2 Dissociated in Plasma for CVD Chamber Cleaning. Applied Sciences. 2018; 8(6):846. https://doi.org/10.3390/app8060846

Chicago/Turabian Style

Boudaden, Jamila; Altmannshofer, Stephan; Wieland, Robert; Pittroff, Michael; Eisele, Ignaz. 2018. "An Approach to Reduce Greenhouse Gases in the Semiconductor Industry Using F2 Dissociated in Plasma for CVD Chamber Cleaning" Appl. Sci. 8, no. 6: 846. https://doi.org/10.3390/app8060846

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