Li, R.; Wu, F.; Huang, H.; Cai, W.; Zhang, Y.; Han, J.
Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy. Appl. Sci. 2023, 13, 9294.
https://doi.org/10.3390/app13169294
AMA Style
Li R, Wu F, Huang H, Cai W, Zhang Y, Han J.
Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy. Applied Sciences. 2023; 13(16):9294.
https://doi.org/10.3390/app13169294
Chicago/Turabian Style
Li, Ruyi, Feibin Wu, Huiling Huang, Weibin Cai, Yantong Zhang, and Jun Han.
2023. "Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy" Applied Sciences 13, no. 16: 9294.
https://doi.org/10.3390/app13169294
APA Style
Li, R., Wu, F., Huang, H., Cai, W., Zhang, Y., & Han, J.
(2023). Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy. Applied Sciences, 13(16), 9294.
https://doi.org/10.3390/app13169294