Li, R.;                     Wu, F.;                     Huang, H.;                     Cai, W.;                     Zhang, Y.;                     Han, J.    
        Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy. Appl. Sci. 2023, 13, 9294.
    https://doi.org/10.3390/app13169294
    AMA Style
    
                                Li R,                                 Wu F,                                 Huang H,                                 Cai W,                                 Zhang Y,                                 Han J.        
                Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy. Applied Sciences. 2023; 13(16):9294.
        https://doi.org/10.3390/app13169294
    
    Chicago/Turabian Style
    
                                Li, Ruyi,                                 Feibin Wu,                                 Huiling Huang,                                 Weibin Cai,                                 Yantong Zhang,                                 and Jun Han.        
                2023. "Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy" Applied Sciences 13, no. 16: 9294.
        https://doi.org/10.3390/app13169294
    
    APA Style
    
                                Li, R.,                                 Wu, F.,                                 Huang, H.,                                 Cai, W.,                                 Zhang, Y.,                                 & Han, J.        
        
        (2023). Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy. Applied Sciences, 13(16), 9294.
        https://doi.org/10.3390/app13169294