Extended Hückel Semi-Empirical Approach as an Efficient Method for Structural Defects Analysis in 4H-SiC
Wozny, J.; Kovalchuk, A.; Podgorski, J.; Lisik, Z. Extended Hückel Semi-Empirical Approach as an Efficient Method for Structural Defects Analysis in 4H-SiC. Materials 2021, 14, 1247. https://doi.org/10.3390/ma14051247
Wozny J, Kovalchuk A, Podgorski J, Lisik Z. Extended Hückel Semi-Empirical Approach as an Efficient Method for Structural Defects Analysis in 4H-SiC. Materials. 2021; 14(5):1247. https://doi.org/10.3390/ma14051247
Chicago/Turabian StyleWozny, Janusz, Andrii Kovalchuk, Jacek Podgorski, and Zbigniew Lisik. 2021. "Extended Hückel Semi-Empirical Approach as an Efficient Method for Structural Defects Analysis in 4H-SiC" Materials 14, no. 5: 1247. https://doi.org/10.3390/ma14051247