Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure
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Marchal, W.; Verboven, I.; Kesters, J.; Moeremans, B.; De Dobbelaere, C.; Bonneux, G.; Elen, K.; Conings, B.; Maes, W.; Boyen, H.G.; Deferme, W.; Van Bael, M.; Hardy, A. Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure. Materials 2017, 10, 123. https://doi.org/10.3390/ma10020123
Marchal W, Verboven I, Kesters J, Moeremans B, De Dobbelaere C, Bonneux G, Elen K, Conings B, Maes W, Boyen HG, Deferme W, Van Bael M, Hardy A. Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure. Materials. 2017; 10(2):123. https://doi.org/10.3390/ma10020123
Chicago/Turabian StyleMarchal, Wouter; Verboven, Inge; Kesters, Jurgen; Moeremans, Boaz; De Dobbelaere, Christopher; Bonneux, Gilles; Elen, Ken; Conings, Bert; Maes, Wouter; Boyen, Hans G.; Deferme, Wim; Van Bael, Marlies; Hardy, An. 2017. "Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure" Materials 10, no. 2: 123. https://doi.org/10.3390/ma10020123