Article Versions Notes

Marchal W, Verboven I, Kesters J, Moeremans B, De Dobbelaere C, Bonneux G, Elen K, Conings B, Maes W, Boyen HG, et al. Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure. Materials. 2017; 10(2):123. https://doi.org/10.3390/ma10020123

Marchal, Wouter, Inge Verboven, Jurgen Kesters, Boaz Moeremans, Christopher De Dobbelaere, Gilles Bonneux, Ken Elen, Bert Conings, Wouter Maes, Hans Gerd Boyen, and et al. 2017. "Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure" Materials 10, no. 2: 123. https://doi.org/10.3390/ma10020123

Marchal, W., Verboven, I., Kesters, J., Moeremans, B., De Dobbelaere, C., Bonneux, G., Elen, K., Conings, B., Maes, W., Boyen, H. G., Deferme, W., Van Bael, M., & Hardy, A. (2017). Steering the Properties of MoOx Hole Transporting Layers in OPVs and OLEDs: Interface Morphology vs. Electronic Structure. Materials, 10(2), 123. https://doi.org/10.3390/ma10020123