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Open AccessArticle

Low-Cost 2D Index and Straightness Measurement System Based on a CMOS Image Sensor

Federal Institute of Metrology METAS, Lindenweg 50, 3003 Bern-Wabern, Switzerland
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Sensors 2019, 19(24), 5461; https://doi.org/10.3390/s19245461
Received: 22 October 2019 / Revised: 25 November 2019 / Accepted: 5 December 2019 / Published: 11 December 2019
(This article belongs to the Special Issue Sensors for Precision Dimensional Metrology)
Accurate traceable measurement systems often use laser interferometers for position measurements in one or more dimensions. Since interferometers provide only incremental information, they are often combined with index sensors to provide a stable reference starting point. Straightness measurements are important for machine axis correction and for systems having several degrees of freedom. In this paper, we investigate the accuracy of an optical two-dimensional (2D) index sensor, which can also be used in a straightness measurement system, based on a fiber-coupled, collimated laser beam pointing onto an image sensor. Additionally, the sensor can directly determine a 2D position over a range of a few millimeters. The device is based on a simple and low-cost complementary metal–oxide–semiconductor (CMOS) image sensor chip and provides sub-micrometer accuracy. The system is an interesting alternative to standard techniques and can even be implemented on machines for real-time corrections. This paper presents the developed sensor properties for various applications and introduces a novel error separation method for straightness measurements. View Full-Text
Keywords: 2D position sensor; 2D index sensor; straightness sensor; machine tool geometry correction 2D position sensor; 2D index sensor; straightness sensor; machine tool geometry correction
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Küng, A.; Bircher, B.A.; Meli, F. Low-Cost 2D Index and Straightness Measurement System Based on a CMOS Image Sensor. Sensors 2019, 19, 5461.

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