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Noise Reduction Techniques and Scaling Effects towards Photon Counting CMOS Image Sensors
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Sensors 2016, 16(4), 517;

Reduction of CMOS Image Sensor Read Noise to Enable Photon Counting

Rambus Inc., Sunnyvale, CA 94089, USA
Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA
Author to whom correspondence should be addressed.
Academic Editor: Albert Theuwissen
Received: 1 February 2016 / Revised: 29 March 2016 / Accepted: 31 March 2016 / Published: 9 April 2016
(This article belongs to the Special Issue Photon-Counting Image Sensors)
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Recent activity in photon counting CMOS image sensors (CIS) has been directed to reduction of read noise. Many approaches and methods have been reported. This work is focused on providing sub 1 e read noise by design and operation of the binary and small signal readout of photon counting CIS. Compensation of transfer gate feed-through was used to provide substantially reduced CDS time and source follower (SF) bandwidth. SF read noise was reduced by a factor of 3 with this method. This method can be applied broadly to CIS devices to reduce the read noise for small signals to enable use as a photon counting sensor. View Full-Text
Keywords: CMOS; image sensor; photon counting; read noise CMOS; image sensor; photon counting; read noise

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Guidash, M.; Ma, J.; Vogelsang, T.; Endsley, J. Reduction of CMOS Image Sensor Read Noise to Enable Photon Counting. Sensors 2016, 16, 517.

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