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Sensors 2015, 15(11), 28764-28771;

A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes

State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
Author to whom correspondence should be addressed.
Academic Editor: Vittorio M. N. Passaro
Received: 3 October 2015 / Revised: 7 November 2015 / Accepted: 9 November 2015 / Published: 13 November 2015
(This article belongs to the Special Issue Carbon MEMS and NEMS for Sensor Applications)
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With its unique structure, the Akiyama probe is a type of tuning fork atomic force microscope probe. The long, soft cantilever makes it possible to measure soft samples in tapping mode. In this article, some characteristics of the probe at its second eigenmode are revealed by use of finite element analysis (FEA) and experiments in a standard atmosphere. Although the signal-to-noise ratio in this environment is not good enough, the 2 nm resolution and 0.09 Hz/nm sensitivity prove that the Akiyama probe can be used at its second eigenmode under FM non-contact mode or low amplitude FM tapping mode, which means that it is easy to change the measuring method from normal tapping to small amplitude tapping or non-contact mode with the same probe and equipment. View Full-Text
Keywords: AFM; quartz tuning fork; higher eigenmode; non-contact; finite element analysis AFM; quartz tuning fork; higher eigenmode; non-contact; finite element analysis

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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Wu, Z.; Guo, T.; Tao, R.; Liu, L.; Chen, J.; Fu, X.; Hu, X. A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes. Sensors 2015, 15, 28764-28771.

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