Matsuya, Y.; Nakano, T.; Kai, T.; Shikazono, N.; Akamatsu, K.; Yoshii, Y.; Sato, T.
A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields. Int. J. Mol. Sci. 2020, 21, 1701.
https://doi.org/10.3390/ijms21051701
AMA Style
Matsuya Y, Nakano T, Kai T, Shikazono N, Akamatsu K, Yoshii Y, Sato T.
A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields. International Journal of Molecular Sciences. 2020; 21(5):1701.
https://doi.org/10.3390/ijms21051701
Chicago/Turabian Style
Matsuya, Yusuke, Toshiaki Nakano, Takeshi Kai, Naoya Shikazono, Ken Akamatsu, Yuji Yoshii, and Tatsuhiko Sato.
2020. "A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields" International Journal of Molecular Sciences 21, no. 5: 1701.
https://doi.org/10.3390/ijms21051701
APA Style
Matsuya, Y., Nakano, T., Kai, T., Shikazono, N., Akamatsu, K., Yoshii, Y., & Sato, T.
(2020). A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields. International Journal of Molecular Sciences, 21(5), 1701.
https://doi.org/10.3390/ijms21051701