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Measurement Back-Action in Quantum Point-Contact Charge Sensing

Solid State Physics Laboratory, ETH Zurich, Schafmattstr. 16, 8093 Zurich, Switzerland
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA
EMPA, 8600 Dübendorf, Switzerland
Theoretische Physik, ETH Zurich, Wolfgang-Pauli-Str. 27, 8093 Zurich, Switzerland
Instituut-Lorentz, Universiteit Leiden, P.O. Box 9506, 2300 RA Leiden, The Netherlands
Institut für Experimentelle und Angewandte Physik, Universität Regensburg, 93040 Regensburg, Germany
FIRST Laboratory, ETH Zurich, Wolfgang-Pauli-Str. 10, 8093 Zurich, Switzerland
Author to whom correspondence should be addressed.
Entropy 2010, 12(7), 1721-1732;
Received: 10 May 2010 / Revised: 21 June 2010 / Accepted: 25 June 2010 / Published: 29 June 2010
(This article belongs to the Collection Quantum Information)
Charge sensing with quantum point-contacts (QPCs) is a technique widely used in semiconductor quantum-dot research. Understanding the physics of this measurement process, as well as finding ways of suppressing unwanted measurement back-action, are therefore both desirable. In this article, we present experimental studies targeting these two goals. Firstly, we measure the effect of a QPC on electron tunneling between two InAs quantum dots, and show that a model based on the QPC’s shot-noise can account for it. Secondly, we discuss the possibility of lowering the measurement current (and thus the back-action) used for charge sensing by correlating the signals of two independent measurement channels. The performance of this method is tested in a typical experimental setup. View Full-Text
Keywords: quantum dots; quantum wires; noise; single-electron tunneling quantum dots; quantum wires; noise; single-electron tunneling
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MDPI and ACS Style

Küng, B.; Gustavsson, S.; Choi, T.; Shorubalko, I.; Pfäffli, O.; Hassler, F.; Blatter, G.; Reinwald, M.; Wegscheider, W.; Schön, S.; Ihn, T.; Ensslin, K. Measurement Back-Action in Quantum Point-Contact Charge Sensing. Entropy 2010, 12, 1721-1732.

AMA Style

Küng B, Gustavsson S, Choi T, Shorubalko I, Pfäffli O, Hassler F, Blatter G, Reinwald M, Wegscheider W, Schön S, Ihn T, Ensslin K. Measurement Back-Action in Quantum Point-Contact Charge Sensing. Entropy. 2010; 12(7):1721-1732.

Chicago/Turabian Style

Küng, Bruno, Simon Gustavsson, Theodore Choi, Ivan Shorubalko, Oliver Pfäffli, Fabian Hassler, Gianni Blatter, Matthias Reinwald, Werner Wegscheider, Silke Schön, Thomas Ihn, and Klaus Ensslin. 2010. "Measurement Back-Action in Quantum Point-Contact Charge Sensing" Entropy 12, no. 7: 1721-1732.

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