Electronics | Highly Cited Papers in 2024 in the Section “Microelectronics”
The “Microelectronics” Section is dedicated to publishing original research articles and cutting-edge reviews on the applications of microelectronics in emerging and challenging technologies, such as electronics operating in extreme environments, such as a vacuum, space, harsh radiation, extreme cold, and other niche applications, alongside advances in their design.
You have free and unlimited access to the full texts of all open access articles published in Electronics (ISSN: 2079-9292). We welcome you to read our most highly cited papers published in 2024, listed below.
1. “Piezoelectric MEMS Energy Harvester for Low-Power Applications”
by George Muscalu, Bogdan Firtat, Adrian Anghelescu, Carmen Moldovan, Silviu Dinulescu, Costin Brasoveanu, Magdalena Ekwinska, Dariusz Szmigiel, Michal Zaborowski, Jerzy Zajac et al.
Electronics 2024, 13(11), 2087; https://doi.org/10.3390/electronics13112087
Available online: https://www.mdpi.com/2079-9292/13/11/2087
2. “Full-Custom 90 nm CNTFET Process Design Kit: Characterization, Modeling, and Implementation”
by Liming Chen, Yuyan Zhang, Zhifeng Chen, Jiming Chen, Huangwei Chen, Jianhua Jiang and Chengying Chen
Electronics 2024, 13(3), 605; https://doi.org/10.3390/electronics13030605
Available online: https://www.mdpi.com/2079-9292/13/3/605
3. “Effect of Proton Irradiation on Complementary Metal Oxide Semiconductor (CMOS) Single-Photon Avalanche Diodes”
by Mingzhu Xun, Yudong Li, Jie Feng, Chengfa He, Mingyu Liu and Qi Guo
Electronics 2024, 13(1), 224; https://doi.org/10.3390/electronics13010224
Available online: https://www.mdpi.com/2079-9292/13/1/224
4. “Unveiling Acoustic Cavitation Characterization in Opaque Chambers through a Low-Cost Piezoelectric Sensor Approach”
by José Fernandes, Paulo J. Ramísio and Hélder Puga
Electronics 2024, 13(8), 1581; https://doi.org/10.3390/electronics13081581
Available online: https://www.mdpi.com/2079-9292/13/8/1581
5. “Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP”
by Shunshun Zheng, Zhangang Zhang, Jiefeng Ye, Xiaojie Lu, Zhifeng Lei, Zhili Liu, Gaoying Geng, Qi Zhang, Hong Zhang and Hui Li
Electronics 2024, 13(11), 2012; https://doi.org/10.3390/electronics13112012
Available online: https://www.mdpi.com/2079-9292/13/11/2012
6. “Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells”
by Cleiton M. Marques, Frédéric Wrobel, Ygor Q. Aguiar, Alain Michez, Frédéric Saigné, Jérôme Boch, Luigi Dilillo and Rubén García Alía
Electronics 2024, 13(10), 1954; https://doi.org/10.3390/electronics13101954
Available online: https://www.mdpi.com/2079-9292/13/10/1954
7. “Temperature Dependence of Total Ionizing Dose Effects of β-Ga2O3 Schottky Barrier Diodes”
by Weili Fu, Teng Ma, Zhifeng Lei, Chao Peng, Hong Zhang, Zhangang Zhang, Tao Xiao, Hongjia Song, Yuangang Wang, Jinbin Wang et al.
Electronics 2024, 13(11), 2215; https://doi.org/10.3390/electronics13112215
Available online: https://www.mdpi.com/2079-9292/13/11/2215
8. “Analysis of Shielding Performance in Double-Layered Enclosures with Integrated Absorbers”
by Jong Hwa Kwon, Chang-Hee Hyoung and Hyun Ho Park
Electronics 2024, 13(22), 4345; https://doi.org/10.3390/electronics13224345
Available online: https://www.mdpi.com/2079-9292/13/22/4345