Advanced Optical Imaging and Interference Detection Techniques
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Optical Sensors".
Deadline for manuscript submissions: 31 March 2026 | Viewed by 11
Special Issue Editor
Special Issue Information
Dear Colleagues,
The flexibility and freedom offered by complex curved optical components have enabled significant advancements in optical system performance and packaging. Significant progress has been made in optical design, optical testing, and optical alignment. This Special Issue explores cutting-edge developments in high-resolution optical measurement techniques, novel interference-based sensing systems, and their applications across scientific and industrial domains. We invite contributions addressing both fundamental innovations and practical implementations that push the boundaries of precision, speed, and functionality in optical technology.
We welcome contributions addressing key challenges and innovations in the following fields:
- Computational imaging (e.g., Fourier ptychography and phase retrieval).
- Ultrafast laser interferometry for nanoscale defect detection.
- Adaptive optics in dynamic environments (e.g., vehicle-mounted laser radar and lithography inspection).
- AI-driven optical system optimization and defect classification.
- Structured light and vortex beams for 3D sensing.
- Interferometric testing of high-order aspheric surfaces.
- Real-time imaging with deep learning reconstruction.
- Precise measurement in super-resolution microscopy and its unprocessed applications.
We look forward to receiving your contributions.
Dr. Lisong Yan
Guest Editor
Manuscript Submission Information
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Keywords
- optical design
- optical testing
- interferometry
- adaptive optics
- laser metrology
- phase retrieval
- real-time measurement
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