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Sensors and Sensing Technologies for Precision Optical Measurement and Metrology

This special issue belongs to the section “Intelligent Sensors“.

Special Issue Information

Dear Colleagues,

Recently, sensors and sensing technologies for precision optical measurement and metrology have shown great significance in precision instruments and equipment, high-end equipment manufacturing, aerospace engineering, and more. This field involves the intersection and integration of multiple disciplines, such as physics, optics, mechanics, information, and materials. It is highly precise and efficient, and demonstrates high resolution and strong performance. Therefore, it has become a research hotspot in many fields globally, and new research results are constantly emerging in basic theories, innovative methods and technologies, new instruments and equipment, and applications.

This Special Issue, therefore, aims to bring together original research and review articles on recent advances, technologies, solutions, applications, and challenges in the field of precision optical measurement technologies.

Potential topics include, but are not limited to, the following: 

  • Optoelectronic sensing technology and intelligent sensors;
  • Fiber grating sensing technology;
  • Fiber Fabry–Perot interferometer sensing technology;
  • Laser radar technology;
  • Laser displacement measurement technology;
  • Material characterization measurement;
  • Optical frequency comb technology;
  • Nano-grating interferometry and lithography manufacturing technology;
  • Spectral confocal technology and instruments;
  • Optical scattering measurement technology;
  • High-resolution and super-resolution imaging technology;
  • Extremely short wavelength nano-measurement technology;
  • Optical sensing for micro–nano metrology;
  • Optical sensors for surface topography;
  • Multi-mode optical hybrid measurement technology;
  • Multi-sensor data fusion;
  • Feature selection and extraction of measurement signals;
  • Machine learning and deep learning methods for measurement signals;
  • Error tracing and calibration.

Dr. Xinghui Li
Dr. Yueqiang Zhang
Guest Editors

Dr. Yueqiang Zhang
Guest Editor Assistant

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • optoelectronic sensing
  • optical measurement
  • precision metrology
  • intelligent instrument

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Sensors - ISSN 1424-8220