Sensors and Sensing Technologies for Precision Optical Measurement and Metrology
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Intelligent Sensors".
Deadline for manuscript submissions: 31 August 2025 | Viewed by 208
Special Issue Editors
2. Tsinghua-Berkeley Shenzhen Institute, Tsinghua University, Shenzhen 518055, China
Interests: optical measurement technology; grating lithography manufacturing; digital grating 3D measurement; machine vision measurement
Special Issues, Collections and Topics in MDPI journals
Interests: optical metrology; quantum precision measurement; photonic-chip-based sensing and measurement
Special Issues, Collections and Topics in MDPI journals
Interests: visual measurement and photometric image analysis; visual navigation and multi-source fusion image perception; pattern recognition and intelligent systems
Special Issue Information
Dear Colleagues,
Recently, sensors and sensing technologies for precision optical measurement and metrology have shown great significance in precision instruments and equipment, high-end equipment manufacturing, aerospace engineering, and more. This field involves the intersection and integration of multiple disciplines, such as physics, optics, mechanics, information, and materials. It is highly precise and efficient, and demonstrates high resolution and strong performance. Therefore, it has become a research hotspot in many fields globally, and new research results are constantly emerging in basic theories, innovative methods and technologies, new instruments and equipment, and applications.
This Special Issue, therefore, aims to bring together original research and review articles on recent advances, technologies, solutions, applications, and challenges in the field of precision optical measurement technologies.
Potential topics include, but are not limited to, the following:
- Optoelectronic sensing technology and intelligent sensors;
- Fiber grating sensing technology;
- Fiber Fabry–Perot interferometer sensing technology;
- Laser radar technology;
- Laser displacement measurement technology;
- Material characterization measurement;
- Optical frequency comb technology;
- Nano-grating interferometry and lithography manufacturing technology;
- Spectral confocal technology and instruments;
- Optical scattering measurement technology;
- High-resolution and super-resolution imaging technology;
- Extremely short wavelength nano-measurement technology;
- Optical sensing for micro–nano metrology;
- Optical sensors for surface topography;
- Multi-mode optical hybrid measurement technology;
- Multi-sensor data fusion;
- Feature selection and extraction of measurement signals;
- Machine learning and deep learning methods for measurement signals;
- Error tracing and calibration.
Dr. Xinghui Li
Dr. Yueqiang Zhang
Guest Editors
Dr. Yueqiang Zhang
Guest Editor Assistant
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- optoelectronic sensing
- optical measurement
- precision metrology
- intelligent instrument
Benefits of Publishing in a Special Issue
- Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
- Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
- Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
- External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
- Reprint: MDPI Books provides the opportunity to republish successful Special Issues in book format, both online and in print.
Further information on MDPI's Special Issue policies can be found here.
