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Advanced Sensors and Measurement Methodologies Using Electromagnetic Phenomena

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".

Deadline for manuscript submissions: 20 January 2026 | Viewed by 29

Special Issue Editors


E-Mail Website
Guest Editor
Department of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Technická 12, 616 00 Brno, Czech Republic
Interests: numerical modeling; coupled model; sensing;measurement method; low-level measurement; electromagnetic field; photonics; noise spectroscopy; IR measurement
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
Department of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Technicka 3082/12, 616 00 Brno, Czech Republic
Interests: plasma science; measurement; laser ablation; electromagnetic detection signals; preservation of historical objects with plasma and corresponding measurement methods; cold and cryogenic plasma
Department of Electrical and Electronic Technology, Faculty of Electrical Engineering and Communication, Brno University of Technology, Technická 10, 616 00 Brno, Czech Republic
Interests: numerical modeling; fluid flow model; electron microscope technology; measurement method; mechanical modeling
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

This Special Issue aims to explore the emerging interconnection of scientific disciplines in the fields of sensors, electronic measurements and metrology. Recently, interconnected physical–chemical–biological sensors with applications at the nanoscale have been innovated, and developing nanotechnologies requires new methods for sensing quantities. In this Special issue of Sensors, topics of interest include, but are not limited to, the following:

- Detection methods for evaluating plasma discharge parameters; 

- The measurement of geomagnetic fields at low levels; 

- Electromagnetic measurements of low-velocity fluid flows;

- Detection methods and measurement systems of pulsed laser ablation systems;

- The detection and evaluation of signals of biological origin;

- Impedance detection and defectoscopic methods;

- System identification using spectral analyses of their power supply.

Prof. Dr. Pavel Fiala
Dr. Miloš Klíma
Dr. Jiri Maxa
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • electromagnetic field
  • nanoparticles
  • impulse measurement
  • hybrid measurement
  • low-level measurement
  • biological parameters measurement
  • defectoscopy
  • impedance
  • spectral analysis

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