Special Issue "Sensors and New Trends in Global Metrology"
Deadline for manuscript submissions: 20 March 2023 | Viewed by 1496
Interests: cutting processes; surface metrology; tribology; maintenance; process diagnostics; additive manufacturing technologies
Special Issues, Collections and Topics in MDPI journals
Special Issue in Materials: Innovative and Modern Technologies of Material Machining in Cutting and Abrasive Processes
Special Issue in Materials: Innovative and Modern Technologies of Material Machining in Cutting and Abrasive Processes—Volume II
Interests: sensor technology; energy harvesting; metrology; measurement uncertainty; environmental measurement; unmanned aerial vehicle; electrical measurement of nonelectrical quantities; virtual instruments; Internet of Things
Interests: surface metrology; optimization of difficult-to-cut materials; sensor technology; metrology; measurement uncertainty; environmental measurement; optimization of geometrical and physical parameters of surface integrity
Special Issues, Collections and Topics in MDPI journals
Special Issue in Materials: Advances in Hard-to-Cut Materials: Manufacturing, Properties, Process Mechanics and Evaluation of Surface Integrity
Special Issue in Information: Fault Diagnosis, Maintenance and Reliability
Special Issue in Electronics: Signal Processing and Analysis of Electrical Circuit
Special Issue in Applied Sciences: Fault Diagnosis of Rotating Machine
Special Issue in Energies: Analysis for Electrical Machines Monitoring
Special Issue in Symmetry: Symmetry in Mechanical Engineering
Special Issue in Materials: “3D” Parametric and Nonparametric Description of Surface Topography in Manufacturing Processes
Special Issue in Materials: Additive Manufacturing and Innovative Welding Technologies for Light Alloys
Special Issue in Applied Sciences: Modeling of Metal Removal Processes
The progressive digitization of science and enterprises is the main cause of the current changes in ensuring high-quality research and production. The purpose of the Special Issue is to create a platform for the exchange of views and experiences as well as the presentation of research results on new trends in the field of searching for and applying new sensor solutions and new trends in global metrology. The subject of the Special Issue concerns the most important development trends in sensors and modern legal and applied metrology. In particular, it includes electrical, medical, chemical, physical, industrial metrology, photometry, and radiometry.
Potential topics include but are not limited to new directions in the development of modern metrology in areas requiring support with measurement infrastructure based on advanced technologies and innovative solutions metrology versus the progressive digitization of manufacturing companies; metrology used directly in production; new plug and play solutions for the integration and automation of metrology in production plants; the role of new and modern metrology in the field of process quality assurance and product control; predictive support for metrology thanks to the use of artificial intelligence; innovative measurement techniques supported by intelligent algorithms for processing large data sets; consumer metrology and product quality; new measurement methods and new general procedures for processing raw experimental data and big experimental data, which were developed in many fields of science derived from metrology (e.g., mechanical and electrical engineering, chemistry, biology, pharmacy, medicine); evolution of scientific metrology that results both from the fast progress of science (e.g., the use of quantum standards) and the increasing demand for measurements at the highest metrological level (e.g., measurements of time in the global navigation satellite systems, GNSS); new trends in the construction of measuring sensors, measuring systems, ionizing radiation measurements, coordinate measurements, thermometry and thermovision measurements, photonic measurement techniques, etc.; new and current trends for the long-term development of metrology, in its broad understanding (acoustics and vibrations, time and frequency, chemistry, length and angle, electricity and magnetism, photometry and radiometry, mass, and above all, metrology as a support tool for industry).
Dr. Jerzy Józwik
Dr. Wojciech Walendziuk
Prof. Dr. Grzegorz Królczyk
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- measurement methods
- legal metrology
- applied metrology
- procedures of signal processing
- intelligent algorithms
- quantum standards
- SI standards