Pattern Recognition in Remote Sensing II
A special issue of Remote Sensing (ISSN 2072-4292). This special issue belongs to the section "Remote Sensing Image Processing".
Deadline for manuscript submissions: 15 January 2025 | Viewed by 6441
Special Issue Editors
Interests: pattern recognition; deep learning; remote sensing; image processing
Special Issues, Collections and Topics in MDPI journals
Interests: pattern recognition; image processing; multi-modal information fusion
Special Issues, Collections and Topics in MDPI journals
Interests: remote sensing image processing
Special Issues, Collections and Topics in MDPI journals
Interests: attern recognition; autonomous navigation; information fusion; non conventional imaging; polarimetric imaging; roas scene analysis; obstacle detection; ADAS; intelligent vehicle
Special Issue Information
Dear Colleagues,
Pattern recognition is a powerful tool for remote sensing image analysis. With the development of deep learning, several remote sensing applications with cutting-edge performance have been achieved in the last decade. However, it is evident that remote sensing has been lagging behind other domains. In this context, this Special Issue encourages the submission of papers that offer recent advances and innovative solutions on the wide topic of remote sensing image analysis. In particular, topics that fall within topics including, but not limited to, the following are welcome:
- New pattern recognition principles and their potential in remote sensing image analysis;
- Low-level image processing techniques (e.g., denoising, enhancing, deblurring, and rectification);
- Mid-level image processing techniques (e.g., feature extraction, feature matching, image mosaic, image fusion, super-resolution, salience detection, and change detection);
- High-level image processing techniques (e.g., object recognition, semantic segmentation, image classification, image captioning, and image understanding);
- Parallel computing and cloud computing techniques;
- Light-weight network and embedding design for remote sensing processing;
- Applications in resource management, disaster monitoring, intelligent agriculture, and smart cities.
Prof. Dr. Chunlei Huo
Dr. Zhiqiang Zhou
Dr. Lurui Xia
Dr. Samia Ainouz
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Remote Sensing is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2700 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- pattern recognition
- deep learning
- remote sensing
- image processing
- artificial intelligence
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Related Special Issue
- Pattern Recognition in Remote Sensing in Remote Sensing (13 articles)