Advances in X-Ray Imaging Technology
A special issue of Photonics (ISSN 2304-6732).
Deadline for manuscript submissions: 30 October 2026 | Viewed by 1605
Special Issue Editor
Special Issue Information
Dear Colleagues,
X-ray imaging technology stands as a cornerstone of modern science, underpinning fields ranging from materials science and biology to medical diagnostics and non-destructive evaluation. Recently, propelled by advancements in sources (synchrotrons, X-ray free-electron lasers, and laboratory systems), the evolution of novel detectors and optics, and the deep integration of artificial intelligence (AI), the field is undergoing a paradigm shift. We are witnessing a transition from static structural observation to multi-dimensional, dynamic, and quantitative characterization. This Special Issue delves into the latest breakthroughs in X-ray imaging, highlighting pioneering methodologies, technological innovations, and practical applications that are reshaping the landscape. It serves as a vital platform for researchers and experts to share cutting-edge insights and discoveries.
Potential topics include, but are not limited to, the following:
- Novel Imaging Modalities: Breakthroughs in X-ray coherent diffraction imaging (CDI), ptychography, and phase-contrast and dark-field imaging, that push the boundaries of spatial and temporal resolution.
- Hardware Innovations: Next-generation instrumentation, including photon-counting detectors, advanced X-ray optics, and the development of compact, high-brightness laboratory X-ray sources and accelerators.
- AI and Computational Imaging: The integration of artificial intelligence and deep learning for low-dose reconstruction, sparse-view sampling, artifact reduction, and automated quantitative analysis or diagnostic support.
- Diverse Applications: Translational research spanning chemical and materials science, biological and medical imaging, industrial non-destructive testing (NDT), and cultural heritage preservation.
Dr. Yudong Yao
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- advanced X-ray imaging
- synchrotron & XFEL
- X-ray coherent diffraction imaging and ptychography
- phase-contrast and dark-field imaging
- X-ray detectors and optics
- deep learning
- multi-modal characterization
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