Ultrafast Dynamics Probed by Photonics and Electron-Based Techniques

A special issue of Photonics (ISSN 2304-6732). This special issue belongs to the section "Lasers, Light Sources and Sensors".

Deadline for manuscript submissions: 31 May 2026 | Viewed by 373

Special Issue Editor


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Guest Editor
Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
Interests: ultrafast electron diffraction and imaging; ultrafast dynamics; in situ/operando techniques with multiple stimuli; ultrafast e-beam instrumentation and methods; ultrafast diagnostics; electron optics

Special Issue Information

Dear Colleagues,

Ultrafast dynamics represents a frontier of modern science and technology, focusing on the capture and understanding of fundamental processes on attosecond to picosecond timescales. Enabled by advanced approaches such as ultrafast electron and X-ray diffraction, ultrafast imaging, and ultrafast spectroscopy, researchers can now directly resolve structural, electronic, and vibrational dynamics in real time. These breakthroughs uncover the mechanisms underlying phase transitions, chemical reactions, and energy/charge transfer at the atomic and electronic levels. This inherently multidisciplinary field bridges the fields of physics, chemistry, materials science, and engineering, offering transformative insights into nonequilibrium states and guiding the design of next-generation functional materials and quantum devices. 

This Special Issue, titled “Ultrafast Dynamics Probed by Photonics and Electron-Based Techniques”, will bring together contributions from leading and emerging researchers worldwide. We welcome original research articles, reviews, and perspectives that advance both the fundamental understanding and methodological development of ultrafast science.

Topics of interest include, but are not limited to, the following:

  • Development and refinement of ultrafast electron, X-ray, and optical probing techniques;
  • Theoretical and computational modeling of nonequilibrium structural and electronic dynamics;
  • Real-time investigations of chemical reactions, phase transitions, and defect dynamics;
  • Multimodal and multiscale approaches for capturing ultrafast processes across time and length scales;
  • Ultrafast photophysics and emergent quantum phenomena in novel materials, heterostructures, and quantum systems;
  • Instrumentation advances enabling higher spatiotemporal resolution and in situ excitation environments. 

We invite you to submit contributions to this Special Issue and look forward to learning of your latest advances in this exciting field.

Dr. Duan Luo
Guest Editor

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Keywords

  • ultrafast dynamics
  • time-resolved spectroscopy
  • ultrafast electron diffraction and microscopy
  • ultrafast X-ray techniques
  • nonequilibrium states
  • multiscale spatiotemporal characterization
  • quantum materials and heterostructures
  • in situ excitation methods

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Published Papers (1 paper)

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Research

11 pages, 3010 KB  
Article
Optimization of Tungsten Anode Target Design for High-Energy Microfocus X-Ray Sources via Geant4 Monte Carlo Simulation
by Yuetian Liu, Lili Li, Yiheng Liu, Xue Zhang, Liwei Xin, Zhengkun Fu, Jinshou Tian, Wei Zhao and Duan Luo
Photonics 2025, 12(11), 1062; https://doi.org/10.3390/photonics12111062 - 27 Oct 2025
Viewed by 251
Abstract
High-energy microfocus X-ray sources are increasingly applied in non-destructive testing, high-resolution imaging, and additive manufacturing. The design and optimization of the anode target critically determine source efficiency, spectral characteristics, and imaging performance. In this study, Monte Carlo simulations using the Geant4 toolkit were [...] Read more.
High-energy microfocus X-ray sources are increasingly applied in non-destructive testing, high-resolution imaging, and additive manufacturing. The design and optimization of the anode target critically determine source efficiency, spectral characteristics, and imaging performance. In this study, Monte Carlo simulations using the Geant4 toolkit were conducted to systematically evaluate transmission and reflection tungsten targets with varied thicknesses and incidence angles under electron beam energies ranging from 100 to 300 keV. The results reveal that, for a microfocus X-ray source operating at a maximum tube voltage of 225 kV, the optimal transmission tungsten target exhibits a thickness of 18 μm, whereas the optimal reflection tungsten target achieves maximum efficiency at a 30 μm thickness with a 25° incidence angle. A nearly linear relationship between electron energy and optimal transmission target thickness is established within the 100–300 keV range. Additionally, the influence of beryllium window thickness and filter materials on the emergent X-ray spectrum is analyzed, demonstrating pathways for spectral hardening and transmission optimization. This study further elucidates the angular–intensity distribution of emitted X-rays, providing critical insights into beam spatial characteristics. Collectively, these findings establish a theoretical foundation for target optimization, enabling enhanced X-ray source performance in high-resolution imaging and supporting applications in detector calibration, flatness correction, beam hardening correction, and radiation shielding design. Full article
(This article belongs to the Special Issue Ultrafast Dynamics Probed by Photonics and Electron-Based Techniques)
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