Super Resolution Optical Microscopy: Sensing and Imaging

A special issue of Photonics (ISSN 2304-6732).

Deadline for manuscript submissions: closed (10 April 2024) | Viewed by 1968

Special Issue Editors

College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China
Interests: super-resolution imaging; organelle dynamics; fluorescent probes
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Guest Editor
College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China
Interests: super-resolution imaging; photonics; metasurface; LiDAR

Special Issue Information

Dear Colleagues,

Breaking the optical diffraction limit has been a longstanding challenge in studying the cellular- and molecularscale activities of living systems and the nanoscale dynamics of novel materials. Various super-resolution microscopies have been developed, of which the most successful is fluorescence labeling super-resolution microscopies (including stimulated emission depletion (STED), single-molecule localization microscopy (SMLM), and structured illumination microscopy (SIM)), which possess high contrast, signal-to-noise ratio, and specificity. Fluorescence labeling methods are very important for these microscopies. Complementary, label-free microscopies exploit the inherent physical properties of samples and fill the gap of fluorescence microscopies. The representatives include chemical microscopies, phase microscopy, interferometric light microscopies, and high-resolution light-field microscopies. In addition, newly developed optical materials and structures, such as optical waveguides, microsphere lenses, super oscillatory lenses, hyper lenses, and metasurfaces, also shine in this field. We will also observe the new computational approaches for achieving super-resolved microscopy.

This Special Issue aims to present an overview of cutting-edge research, results, and their applications. We welcome broad, visionary contributions in the form of short research reports as well as collections of reviews and accomplishments. We are excited to invite researchers to submit their contributions to this Special Issue. Topics include but are not limited to:

  • Fluorescence super-resolution microscopies;
  • Fluorescence labeling methods in super-resolution microscopy;
  • Label-free super-resolution microscopies;
  • Chemical super-resolution microscopies;
  • Interferometric light microscopies;
  • High-resolution light-field microscopies;
  • Plasmonic-based super resolution microscopies;
  • Microsphere-aided super resolution microscopies;
  • Metasurface-aided super resolution microscopies;
  • Optical waveguide-aided microscopies;
  • New computational approaches for achieving super-resolved microscopy.

We look forward to receiving your contributions.

Dr. Yubing Han
Dr. Mingwei Tang 
Guest Editors

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Keywords

  • super-resolution microscopy
  • computational approaches
  • nanomaterials
  • metamaterials

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Published Papers (1 paper)

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Review

17 pages, 5764 KiB  
Review
Far-Field Super-Resolution Microscopy Using Evanescent Illumination: A Review
by Qianwei Zhang, Haonan Zhang, Xiaoyu Yang, Xu Liu, Mingwei Tang and Qing Yang
Photonics 2024, 11(6), 528; https://doi.org/10.3390/photonics11060528 - 1 Jun 2024
Viewed by 1422
Abstract
The resolution of conventional optical microscopy is restricted by the diffraction limit. Light waves containing higher-frequency information about the sample are bound to the sample surface and cannot be collected by far-field optical microscopy. To break the resolution limit, researchers have proposed various [...] Read more.
The resolution of conventional optical microscopy is restricted by the diffraction limit. Light waves containing higher-frequency information about the sample are bound to the sample surface and cannot be collected by far-field optical microscopy. To break the resolution limit, researchers have proposed various far-field super-resolution (SR) microscopy imaging methods using evanescent waves to transfer the high-frequency information of samples to the low-frequency passband of optical microscopy. Optimization algorithms are developed to reconstruct a SR image of the sample by utilizing the high-frequency information. These techniques can be collectively referred to as spatial-frequency-shift (SFS) SR microscopy. This review aims to summarize the basic principle of SR microscopy using evanescent illumination and introduce the advances in this research area. Some current challenges and possible directions are also discussed. Full article
(This article belongs to the Special Issue Super Resolution Optical Microscopy: Sensing and Imaging)
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