Advances in Laser Measurement
A special issue of Photonics (ISSN 2304-6732). This special issue belongs to the section "Optical Interaction Science".
Deadline for manuscript submissions: 31 July 2025 | Viewed by 663
Special Issue Editor
Interests: laser self-mixing interferometer; optical fiber sensing technology; modulation/demodulation technology; digital signal processing; optical frequency comb-based geometric and spectral precision measurement technology
Special Issue Information
Dear Colleagues,
In the realm of modern science and technology, the pursuit of the increasingly accurate measurement of physical quantities has become a paramount objective. Laser measurement technology stands out due to its exceptional attributes, including traceability, unparalleled precision, and an ultra-large measurement range that spans thousands of kilometers.
On one hand, the continuous exploration and application of novel laser sources, including continuous lasers, pulse lasers, and femtosecond frequency combs, have propelled the advancement of measurement speed and accuracy. On the other hand, the development of efficient signal processing methods, such as adaptive filtering, de-noising, and enhancement techniques, has significantly improved measurement stability and reliability. The integration of artificial intelligence technology further promotes measurement efficiency and accuracy, ushering in a new era of automated and intelligent measurement.
Moreover, with the advancement of semiconductor, fiber, and micro-chip laser technology, laser precision measurement equipment is evolving towards miniaturization and portability. This trend enables the broader adoption and utilization of laser measurement technology in various scientific and industrial fields.
This Special Issue will further explore the latest developments in laser measurement, share cutting-edge research results, and look forward to future development trends. Researchers are invited to submit their contributions to this Special Issue.
Dr. Wei Xia
Guest Editor
Manuscript Submission Information
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Keywords
- micro- and nanometrology
- metrology and instruments for integrated circuits
- in-process and inline metrology
- optical metrology and inspection
- surface metrology
- material characterization
- machine learning and signal processing
- intelligent instrument for automation
- sensors and actuators
- uncertainty, traceability and calibration
- optical imaging
- optical measurement
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