Terahertz (THz) Science in Photonics

A special issue of Photonics (ISSN 2304-6732).

Deadline for manuscript submissions: closed (30 April 2026) | Viewed by 2822

Special Issue Editors


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Guest Editor
Institute of Fluid Physics, China Academy of Engineering Physics, No. 64 Mianshan Road, Mianyang 621900, China
Interests: time-resolved terahertz spectroscopy; terahertz imaging; terahertz spectroscopy; high-field THz generation; terahertz functional devices

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Guest Editor
College of Materials Science and Engineering, Sichuan University, No. 24 South Section 1, Yihuan Road, Chengdu 610065, China
Interests: millimeter waveguide/fiber; sub-terahertz functional materials; multiferroics
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Guest Editor
College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Weijin Road No. 92, Nankai District, Tianjin 300072, China
Interests: terahertz devices; terahertz plasmonics; terahertz metasurfaces; high-power terahertz sources; terahertz communications

Special Issue Information

Dear Colleagues,

Terahertz (THz) photonics stands at the frontier of cutting-edge research, bridging the gap between photonics and electronics to unlock transformative applications in communications, sensing, imaging, and spectroscopy. The THz frequency range offers unique capabilities for non-invasive security screening, biomedical diagnostics, ultra-fast wireless communication systems (6G and beyond), etc. Despite its immense potential, challenges in achieving efficient THz generation, detection, and functional devices persist.

We are pleased to invite you contribute to this Special Issue of Photonics, which aligns closely with the journal’s scope and focuses on novel optical phenomena, materials, devices, and systems across the electromagnetic spectrum, including terahertz frequencies. Our goal is to compile a collection of ​​high-quality articles​​ that explore emerging paradigms in THz photonics. The aims of this Special Issue are to advance the understanding of THz light–matter interactions, device engineering, and system integration and to highlight cutting-edge advancements in terahertz science and technology, focusing on photonics-driven innovations.

This Special Issue welcomes original research articles and reviews. Research areas may include (but are not limited to) the following:

  1. Novel THz sources and detectors.
  2. Metamaterials, plasmonics, and metasurfaces for THz functional devices.
  3. THz spectroscopy and imaging systems.
  4. THz materials and physics.
  5. Other applications of THz technology. 

We look forward to receiving your contributions.

Dr. Jiang Li
Prof. Dr. Qiwu Shi
Dr. Yanfeng Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • terahertz sources
  • THz detectors
  • THz spectroscopy
  • THz imaging
  • metamaterials and metasurfaces
  • time-resolved terahertz spectroscopy

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Published Papers (1 paper)

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Review

28 pages, 4051 KB  
Review
Application of Terahertz Detection Technology in Non-Destructive Thickness Measurement
by Hongkai Li, Zichen Zhang, Hongkai Nian, Zhixuan Chen, Shichuang Jiang, Fan Ding, Dong Sun and Hongyi Lin
Photonics 2025, 12(12), 1191; https://doi.org/10.3390/photonics12121191 - 3 Dec 2025
Viewed by 2117
Abstract
Terahertz (THz) waves, situated between the infrared and microwave regions, possess distinctive properties such as non-contact, high penetration, and high resolution. These properties render them highly advantageous for non-destructive thickness measurement of multilayer structural materials. In comparison with conventional ultrasound or X-ray techniques, [...] Read more.
Terahertz (THz) waves, situated between the infrared and microwave regions, possess distinctive properties such as non-contact, high penetration, and high resolution. These properties render them highly advantageous for non-destructive thickness measurement of multilayer structural materials. In comparison with conventional ultrasound or X-ray techniques, THz thickness measurement has the capacity to acquire thickness data for multilayer structures without compromising the integrity of the specimen and is characterized by its environmental sustainability. The extant THz thickness measurement techniques principally encompass time-domain spectroscopy, frequency-domain spectroscopy, and model-based inversion and deep learning methods. A variety of methodologies have been demonstrated to possess complementary advantages in addressing subwavelength-scale thin layers, overlapping multilayer interfaces, and complex environmental interferences. These methodologies render them suitable for a range of measurement scenarios and precision requirements. A wide range of technologies related to this field have been applied in various disciplines, including aerospace thermal barrier coating inspection, semiconductor process monitoring, automotive coating quality assessment, and oil film thickness monitoring. The ongoing enhancement in system integration and continuous algorithm optimization has led to significant advancements in THz thickness measurement, propelling it towards high resolution, real-time performance, and intelligence. This development offers a wide range of engineering applications with considerable potential for future growth and innovation. Full article
(This article belongs to the Special Issue Terahertz (THz) Science in Photonics)
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