Transmission Electron Microscopy for Nanomaterials Research Advances
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Synthesis, Interfaces and Nanostructures".
Deadline for manuscript submissions: 30 November 2024 | Viewed by 9995
Special Issue Editors
Interests: transmission electron microscopy (TEM); scanning electron microscopy (SEM); focused ion beam (FIB); condensed matter physics; nanomaterials; radiation sensitive materials
Interests: physics; electron microscopy; solid state physics; atomic resolution imaging and spectroscopies in TEM; electron diffraction; convergent beam electron diffraction (CBED); coherent electron diffraction imaging; in-line electron holography; low-dose atomic resolution imaging in TEM
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Since Ruska and Knoll proof of concept of transmission electron microscope, in 1931, technological advances and methodological development have made Transmission Electron Microscopy (TEM) a complex discipline, counting a vast variety of approaches to understand the morphological, structural, chemical and magnetic properties of the matter at the highest spatial resolution. Due to its strong transversality and high flexibility, TEM enables to solve fundamental and applied research problems, contributing to the progress in many fields of knowledge, such as physics, materials science, biology, medicine, engineering, chemistry, nanoscience and nanotechnology.
The last years have seen a further boost in TEM thanks to the introduction of effective aberration correctors for electron lenses, new detectors for imaging, diffraction and spectroscopies, monochromators on primary beam, new capabilities for in operando experiments, new tools for cryoEM, all complemented by the huge progress in computer science, pressing the development of novel methods to investigate organic and inorganic matter.
This special issue focuses on TEM studies for nanomaterials research advances. An upcoming aim is to show how the most recent technological and methodological developments in TEM impact on the comprehension of fundamental and subtle properties of nanomaterials, supplying the necessary knowledge for basic understanding of the nanoscience phenomena and for conscious design of new nanomaterials.
It is our pleasure to announce the opening of the submission for this special issue.
Full papers, communications, and reviews are all welcome.
Dr. Antonietta Taurino
Dr. Elvio Carlino
Guest Editors
Manuscript Submission Information
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Keywords
- HRTEM
- HAADF
- electron diffraction
- 4DSTEM
- electron holography
- TEM tomography
- EELS
- EDS
- in operando
- cryoEM
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