Microscopy Techniques in Advanced Materials

Dear Colleagues,

This Special Issue is dedicated to scanning probe microscopy (SPM) applications in the field of materials science. The SPM technique allows us to measure, visualize, and determine the properties of materials in the nanoscale. SPM has the potential to manipulate nano- and micro-sized particles, build nano- and micro-structures, characterize surfaces, visualize structures at the micro- and nano-scales, and print structures. Research articles are welcomed that focus on any of the following topics: nanoparticles and nanocomposites used for signal increasing in SPMs, probe modification and the use of different kinds of probes, and the representation of data analysis obtained by such techniques. SPMs, such as atomic force microscopy, scanning electrochemical microscopy, scanning ion conductance microscopy, among others, are used for materials characterization and/or manipulation are highly recommended. The characterization of polymers, biological samples, hard/soft surfaces, and new techniques can offer new possibilities for manipulating and detecting data in different ranges of speed and accuracy at the microscale. Therefore, research regarding the accurate positioning and manipulation of nano- and micro-sized objects by micro-robotics, micro-grippers, micro-electromechanical systems, etc., are also welcomed.

In addition, articles related to biological and nonbiological material analyses using various microscopy techniques, such as light, fluorescence, confocal, etc., together with any advanced tools, and algorithms for visual data analysis will be considered in this issue.

Dr. Inga Morkvenaite-Vilkonciene
Dr. Baltramiejus Jakštys
Guest Editors

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