Selected Papers from the International Beam Instrumentation Conference (IBIC) Series
A special issue of Instruments (ISSN 2410-390X).
Deadline for manuscript submissions: 20 December 2026 | Viewed by 2646
Editors
Interests: accelerator design and optimisation; novel beam diagnostics; applications of accelerators; high energy discovery machines; antimatter facilities; medical accelerators; accelerators-on-a-chip
Special Issues, Collections and Topics in MDPI journals
Interests: particle accelerators; electron beam diagnostics; control systems; machine learning; artificial intelligence.
Interests: particle accelerator; electromagnetism; electron beam diagnostics
Special Issues, Collections and Topics in MDPI journals
Interests: particle accelerator; particle interaction with matter; beam diagnostics; beam cooling
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The International Beam Instrumentation Conference (IBIC) is dedicated to exploring the physics and engineering challenges of beam diagnostic and measurement techniques for particle accelerators worldwide.
We are delighted to announce that this Special Issue of Instruments will allow conference delegates to publish an expanded version of their conference proceedings in a peer-reviewed journal with global reach and impact.
Prof. Dr. Carsten P. Welsch
Mrs. Tonia Batten
Prof. Dr. Alessandro Cianchi
Dr. Thibaut Lefevre
Dr. Junxia Wu
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Instruments is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Publisher's Notice
As stated above, the central purpose of this Special Issue is to present selected research from the International Beam Instrumentation Conference (IBIC) series. Given this purpose, and the fact that the Guest Editor team is composed of members of the IBIC Scientific Programme Committee who are actively involved in relevant research, the Guest Editors’ contribution to this Special Issue may be greater than that of standard Special Issues published by MDPI. Further details on MDPI's Special Issue guidelines can be found here: https://www.mdpi.com/special_issues_guidelines. The Editorial Office and Editor-in-Chief of Instruments have approved this, and MDPI's standard manuscript editorial processing procedure (https://www.mdpi.com/editorial_process) will be applied to all submissions. As per our standard procedure, Guest Editors are excluded from participating in the editorial process for their submission and/or for submissions from persons with whom a potential conflict of interest may exist. More details on MDPI’s Conflict of Interest policy for reviewers and editors can be found here: https://www.mdpi.com/ethics#_bookmark22.
Keywords
- beam charge and current monitors
- beam loss monitors and machine protection
- beam position monitors
- transverse profile and emittance monitors
- longitudinal diagnostics and synchronization
- feedback systems and beam stability
- data acquisition and processing platforms
- machine parameter measurements
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