Electron and Atomic Structures in Fluorescence Spectroscopy of X-ray and the VUV Range
A special issue of International Journal of Molecular Sciences (ISSN 1422-0067). This special issue belongs to the section "Physical Chemistry and Chemical Physics".
Deadline for manuscript submissions: closed (30 January 2024) | Viewed by 277
Special Issue Editor
Special Issue Information
Dear Colleagues,
Fluorescence spectroscopy is widely used to obtain information about the electronic and atomic structures of matter, largely due to the fact that methods based on "photon in–photon out" processes contribute a small perturbation to the object under study.
Recent developments in sources of exciting radiation such as synchrotrons, free electron lasers (FELs) and high harmonic generators (HHGs) have led to a tremendous increase in the number of works using a wide range of methods for studying molecules, clusters and solids that differ both in the energy of exciting radiation (e.g., the expanded fine structure of X-ray absorption (EXAFS) and near-edge X-ray absorption structures (XANESs)) and fluorescence (e.g., photon-induced fluorescence spectroscopy (PIFS) and resonant inelastic X-ray scattering (RIXS)).
The purpose of this Special Issue is to collect original research papers and reviews detailing modern applications of the PIFS, RIXS, EXAFS and XANES techniques and achievements in understanding the features of electron and atomic structures of matter obtained using these methods. Works investigating the physics of electromagnetic radiation interactions with multielectron systems (atoms, molecules and clusters) are also welcome.
Prof. Dr. Victor Sukhorukov
Guest Editor
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Keywords
- EXAFS
- XANES
- RIXS
- PIFS
- electron and atomic structure of matter
- interaction of electromagnetic radiation with many-electron systems
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