Non-Invasive Methods for Analysis and Diagnostic in the Field of Cultural Heritage
A special issue of Heritage (ISSN 2571-9408).
Deadline for manuscript submissions: 1 May 2025 | Viewed by 466
Special Issue Editors
Interests: environmental analytical chemistry; analytical chemistry applied to cultural heritage
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
This Special Issue will focus on the latest results concerning the development and the application of non-invasive methods for analysis and diagnostics in the cultural heritage field. The need for detailed information about compositional and structural characteristics of objects realized with different materials and variegate techniques actually pushes for a constant effort in the development of new instrumentation used for the application of all these methodologies. A further aim of this Issue is the optimization of simultaneous uses of many different and complementary methods on the same case, widening the global observation capability and providing a more complete set of information. The techniques of interest will include ion beam analysis, X-ray fluorescence, multispectral and hyperspectral imaging, Raman spectroscopy and FTIR spectroscopy. The combined use of conventional and well-established methods with interesting and valuable case studies will be welcomed.
Prof. Dr. Paola Fermo
Dr. Giuseppe Politi
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Heritage is an international peer-reviewed open access monthly journal published by MDPI.
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Keywords
- non-invasive methodology
- ion beam analysis
- X-ray fluorescence
- multispectral and hyperspectral imaging
- Raman spectroscopy
- FTIR spectroscopy
- neutron and X-ray radiography and tomography
- X-ray diffraction
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