Breakthroughs in Advanced Medical X-Ray and CT Imaging: From Technology to Clinical Application

A special issue of Diagnostics (ISSN 2075-4418). This special issue belongs to the section "Medical Imaging and Theranostics".

Deadline for manuscript submissions: 31 March 2026 | Viewed by 5

Special Issue Editor


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Guest Editor
Department of Physics & Astronomy, Louisiana State University, Baton Rouge, LA, USA
Interests: medical imaging; image processing and deep learning; interferometric imaging; imaging system design and optimization reducing patient dose; imaging time; image reconstruction with physical modeling; deep-learning for oncological prediction and staging; mathematical (PDE) models of tumor growth and treatment; segmentation and registration

Special Issue Information

Dear Colleagues,

Advances in X-ray and CT imaging physics continue to transform diagnostic capabilities, bridging the gap between cutting-edge technology and clinical practice. Among the most promising innovations are X-ray and CT interferometry, phase-contrast imaging, and photon-counting detector computed tomography (PCD-CT). These techniques enable unprecedented improvements in contrast sensitivity, spatial resolution, material differentiation, and dose efficiency, opening new horizons for disease detection, tissue characterization, and functional imaging.

This Special Issue aims to highlight breakthroughs across advanced X-ray and CT imaging, including system design, phase- and spectral-based techniques, algorithmic innovations, and translational studies. We welcome original research articles, reviews, and technical notes addressing, but not limited to, the following areas:

  • Phase- and small-angle-scatter sensitive X-ray technology and CT imaging, in particular interferometry, propagation-based, edge-illumination methods. Topics include novel optics, detectors, sources, efficient attenuation phase and/or dark field (related to small angle scatter) retrieval strategies, artifact removal, lowering dose, improving quantitative diagnostics for multi-modal, preclinical and clinical, and other biomedical applications.
  • Photon-counting detector CT: material decomposition, high-resolution imaging, beam-hardening reduction, imaging with novel contrast agents, dose efficiency, noise/artifact reduction.
  • Low-dose, high resolution and quantitative imaging: novel methods for lower dose reconstructions, material decomposition, multi-contrast methods, and tissue characterization.
  • AI and machine learning approaches tailored for multi-modal, multi-energy imaging data.
  • Preclinical and clinical methods demonstrating novel diagnostic value and translational potential.

Compiling contributions from medical physicists, radiologists, engineers, computer scientists, and related disciplines, this Special Issue seeks to foster interdisciplinary collaboration and accelerate the clinical translation of next-generation X-ray/CT imaging technologies into practice.

Dr. Joyoni Dey
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Diagnostics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • advanced X-ray CT imaging
  • X-ray CT interferometry
  • phase-contrast X-ray
  • photon-counting detectors

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Published Papers

This special issue is now open for submission.
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