New Challenges in Thin Films and Nanotechnologies
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials Science and Engineering".
Deadline for manuscript submissions: 30 November 2026 | Viewed by 586
Editors
Interests: sputtering; thin films; raman spectroscopy; X-ray diffraction
Interests: thin film; high pressure; semiconductor; photocatalysis; metal oxide; heterojunction
Special Issue Information
Dear Colleagues,
Application trends in nanotechnology, advanced device architectures, and the evolution of functional materials are driving significant progress in modern science. This poses new challenges in the advancement of thin film deposition techniques, as well as the development of precise characterization methodologies. Therefore, this Special Issue aims to present the latest ideas, experimental results, and theoretical models in the field of thin films, from fundamental synthesis and simulation to practical industrial use.
Areas relevant to this Special Issue include, but are not limited to, the deposition and optimization of thin films for high-performance applications, such as electrochemical sensors and Surface-Enhanced Raman Scattering (SERS). We welcome contributions involving the computational simulation of the sputtering process, real-time monitoring using Optical Emission Spectroscopy (OES), and advanced structural analysis using Synchrotron radiation and high-resolution techniques. Furthermore, the integration of artificial intelligence and machine learning for material property prediction, as well as the development of novel coatings for strategic sectors like energy, biotechnology, and optoelectronics, are also key topics of interest.
Dr. Nilton Francelosi Azevedo Neto
Prof. Dr. André L. J. Pereira
Prof. Dr. Francisco Xavier Nobre
Guest Editors
Manuscript Submission Information
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Keywords
- thin film deposition
- surface-enhanced raman scattering (SERS)
- X-ray diffraction (XRD)
- raman spectroscopy
- computational simulation and modeling
- artificial intelligence in materials science
- synchrotron radiation analysis
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