Kopytko, M.; Gomółka, E.; Manyk, T.; Michalczewski, K.; Kubiszyn, Ł.; Rutkowski, J.; Martyniuk, P.
Numerical Analysis of Dark Currents in T2SL nBn Detector Grown by MBE on GaAs Substrate. Proceedings 2019, 27, 37.
https://doi.org/10.3390/proceedings2019027037
AMA Style
Kopytko M, Gomółka E, Manyk T, Michalczewski K, Kubiszyn Ł, Rutkowski J, Martyniuk P.
Numerical Analysis of Dark Currents in T2SL nBn Detector Grown by MBE on GaAs Substrate. Proceedings. 2019; 27(1):37.
https://doi.org/10.3390/proceedings2019027037
Chicago/Turabian Style
Kopytko, Małgorzata, Emilia Gomółka, Tetiana Manyk, Krystian Michalczewski, Łukasz Kubiszyn, Jarosław Rutkowski, and Piotr Martyniuk.
2019. "Numerical Analysis of Dark Currents in T2SL nBn Detector Grown by MBE on GaAs Substrate" Proceedings 27, no. 1: 37.
https://doi.org/10.3390/proceedings2019027037
APA Style
Kopytko, M., Gomółka, E., Manyk, T., Michalczewski, K., Kubiszyn, Ł., Rutkowski, J., & Martyniuk, P.
(2019). Numerical Analysis of Dark Currents in T2SL nBn Detector Grown by MBE on GaAs Substrate. Proceedings, 27(1), 37.
https://doi.org/10.3390/proceedings2019027037
