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Journal: Proceedings, 2018
Volume: 2
Number: 999

Article: UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors
Authors: by Manuel Bastuck, Donatella Puglisi, Anita Lloyd Spetz, Andreas Schütze, Tilman Sauerwald and Mike Andersson
Link: https://www.mdpi.com/2504-3900/2/13/999

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