UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors †
Abstract
:1. Introduction
2. Materials and Methods
3. Results and Discussion
3.1. Influence of the UV Light
3.2. Influence of the Gate Bias
4. Conclusions
Author Contributions
Acknowledgments
Conflicts of Interest
References
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Bastuck, M.; Puglisi, D.; Spetz, A.L.; Schütze, A.; Sauerwald, T.; Andersson, M. UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors. Proceedings 2018, 2, 999. https://doi.org/10.3390/proceedings2130999
Bastuck M, Puglisi D, Spetz AL, Schütze A, Sauerwald T, Andersson M. UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors. Proceedings. 2018; 2(13):999. https://doi.org/10.3390/proceedings2130999
Chicago/Turabian StyleBastuck, Manuel, Donatella Puglisi, Anita Lloyd Spetz, Andreas Schütze, Tilman Sauerwald, and Mike Andersson. 2018. "UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors" Proceedings 2, no. 13: 999. https://doi.org/10.3390/proceedings2130999
APA StyleBastuck, M., Puglisi, D., Spetz, A. L., Schütze, A., Sauerwald, T., & Andersson, M. (2018). UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors. Proceedings, 2(13), 999. https://doi.org/10.3390/proceedings2130999