Spagnolo, N.; Lumino, A.; Polino, E.; Rab, A.S.; Wiebe, N.; Sciarrino, F.
Machine Learning for Quantum Metrology. Proceedings 2019, 12, 28.
https://doi.org/10.3390/proceedings2019012028
AMA Style
Spagnolo N, Lumino A, Polino E, Rab AS, Wiebe N, Sciarrino F.
Machine Learning for Quantum Metrology. Proceedings. 2019; 12(1):28.
https://doi.org/10.3390/proceedings2019012028
Chicago/Turabian Style
Spagnolo, Nicolò, Alessandro Lumino, Emanuele Polino, Adil S. Rab, Nathan Wiebe, and Fabio Sciarrino.
2019. "Machine Learning for Quantum Metrology" Proceedings 12, no. 1: 28.
https://doi.org/10.3390/proceedings2019012028
APA Style
Spagnolo, N., Lumino, A., Polino, E., Rab, A. S., Wiebe, N., & Sciarrino, F.
(2019). Machine Learning for Quantum Metrology. Proceedings, 12(1), 28.
https://doi.org/10.3390/proceedings2019012028