Ge, X.; Yu, Q.; Chen, Z.; Jin, Z.; Qi, X.; Wang, R.; Meng, K.; Wang, W.; Li, H.; Liu, G.;
et al. Measurement of Enhanced Inversion Factor of InGaAs-Based Well-Island Composite Structure by Photoluminescence Spectra from Dual Facets. Photonics 2025, 12, 834.
https://doi.org/10.3390/photonics12090834
AMA Style
Ge X, Yu Q, Chen Z, Jin Z, Qi X, Wang R, Meng K, Wang W, Li H, Liu G,
et al. Measurement of Enhanced Inversion Factor of InGaAs-Based Well-Island Composite Structure by Photoluminescence Spectra from Dual Facets. Photonics. 2025; 12(9):834.
https://doi.org/10.3390/photonics12090834
Chicago/Turabian Style
Ge, Xing, Qingnan Yu, Zixuan Chen, Zeng Jin, Xinyang Qi, Ru Wang, Kang Meng, Wei Wang, Hongxu Li, Gang Liu,
and et al. 2025. "Measurement of Enhanced Inversion Factor of InGaAs-Based Well-Island Composite Structure by Photoluminescence Spectra from Dual Facets" Photonics 12, no. 9: 834.
https://doi.org/10.3390/photonics12090834
APA Style
Ge, X., Yu, Q., Chen, Z., Jin, Z., Qi, X., Wang, R., Meng, K., Wang, W., Li, H., Liu, G., & Wu, J.
(2025). Measurement of Enhanced Inversion Factor of InGaAs-Based Well-Island Composite Structure by Photoluminescence Spectra from Dual Facets. Photonics, 12(9), 834.
https://doi.org/10.3390/photonics12090834
