Schmid, D.; Eisermann, R.; Peczek, A.; Winzer, G.; Zimmermann, L.; Krenek, S.
Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation. Photonics 2025, 12, 234.
https://doi.org/10.3390/photonics12030234
AMA Style
Schmid D, Eisermann R, Peczek A, Winzer G, Zimmermann L, Krenek S.
Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation. Photonics. 2025; 12(3):234.
https://doi.org/10.3390/photonics12030234
Chicago/Turabian Style
Schmid, Daniel, René Eisermann, Anna Peczek, Georg Winzer, Lars Zimmermann, and Stephan Krenek.
2025. "Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation" Photonics 12, no. 3: 234.
https://doi.org/10.3390/photonics12030234
APA Style
Schmid, D., Eisermann, R., Peczek, A., Winzer, G., Zimmermann, L., & Krenek, S.
(2025). Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation. Photonics, 12(3), 234.
https://doi.org/10.3390/photonics12030234