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Journal: Photonics, 2025
Volume: 12
Number: 136
Article:
Modeling Dual-SiOxN Thin-Film Edge Coupler with Ultra-Low Loss and Large Alignment Tolerance
Authors:
by
Zhaozhen Chen, Xin Fu, Lei Zhang and Zhengsheng Han
Link:
https://www.mdpi.com/2304-6732/12/2/136
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