Sun, Y.; Li, W.; Xing, X.; Wang, J.; Hu, P.; Tan, J.
A Picometre-Level Resolution Test Method without Nonlinearity for Heterodyne Interferometer Measurement Electronics. Photonics 2024, 11, 331.
https://doi.org/10.3390/photonics11040331
AMA Style
Sun Y, Li W, Xing X, Wang J, Hu P, Tan J.
A Picometre-Level Resolution Test Method without Nonlinearity for Heterodyne Interferometer Measurement Electronics. Photonics. 2024; 11(4):331.
https://doi.org/10.3390/photonics11040331
Chicago/Turabian Style
Sun, Yunke, Wenjun Li, Xu Xing, Jianing Wang, Pengcheng Hu, and Jiubin Tan.
2024. "A Picometre-Level Resolution Test Method without Nonlinearity for Heterodyne Interferometer Measurement Electronics" Photonics 11, no. 4: 331.
https://doi.org/10.3390/photonics11040331
APA Style
Sun, Y., Li, W., Xing, X., Wang, J., Hu, P., & Tan, J.
(2024). A Picometre-Level Resolution Test Method without Nonlinearity for Heterodyne Interferometer Measurement Electronics. Photonics, 11(4), 331.
https://doi.org/10.3390/photonics11040331