Article Versions Notes

Yue J, Cui J, Zheng Z, Liu J, Zhao Y, Cui S, Yu Y, Wang Y, Zhao Y, Luan J, et al. Picometer-Sensitivity Surface Profile Measurement Using Swept-Source Phase Microscopy. Photonics. 2024; 11(10):968. https://doi.org/10.3390/photonics11100968

Yue, Jinyun, Jinze Cui, Zhaobo Zheng, Jianjun Liu, Yu Zhao, Shiwei Cui, Yao Yu, Yi Wang, Yuqian Zhao, Jingmin Luan, and et al. 2024. "Picometer-Sensitivity Surface Profile Measurement Using Swept-Source Phase Microscopy" Photonics 11, no. 10: 968. https://doi.org/10.3390/photonics11100968

Yue, J., Cui, J., Zheng, Z., Liu, J., Zhao, Y., Cui, S., Yu, Y., Wang, Y., Zhao, Y., Luan, J., Liu, J., & Ma, Z. (2024). Picometer-Sensitivity Surface Profile Measurement Using Swept-Source Phase Microscopy. Photonics, 11(10), 968. https://doi.org/10.3390/photonics11100968