Guo, X.; Yang, D.; Qiao, J.; Zhang, H.; Ye, T.; Wei, N.
Radiation-Induced Degradation Mechanisms in Silicon MEMS Under Coupled Thermal and Mechanical Fields. Processes 2025, 13, 2902.
https://doi.org/10.3390/pr13092902
AMA Style
Guo X, Yang D, Qiao J, Zhang H, Ye T, Wei N.
Radiation-Induced Degradation Mechanisms in Silicon MEMS Under Coupled Thermal and Mechanical Fields. Processes. 2025; 13(9):2902.
https://doi.org/10.3390/pr13092902
Chicago/Turabian Style
Guo, Xian, Deshou Yang, Jibiao Qiao, Hui Zhang, Tong Ye, and Ning Wei.
2025. "Radiation-Induced Degradation Mechanisms in Silicon MEMS Under Coupled Thermal and Mechanical Fields" Processes 13, no. 9: 2902.
https://doi.org/10.3390/pr13092902
APA Style
Guo, X., Yang, D., Qiao, J., Zhang, H., Ye, T., & Wei, N.
(2025). Radiation-Induced Degradation Mechanisms in Silicon MEMS Under Coupled Thermal and Mechanical Fields. Processes, 13(9), 2902.
https://doi.org/10.3390/pr13092902