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Journal: ProcessesVolume: 13Number: 3040
Article: Multi-Scale Attention-Augmented YOLOv8 for Real-Time Surface Defect Detection in Fresh Soybeans
  • Authors:
  • Zhili Wu1,2,3,
  • Yakai He1,2,* and
  • Zhilong Du1,2,3,*
  • et al.
Link: https://www.mdpi.com/2227-9717/13/10/3040

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