Jang, Y.J.; Yun, D.; Shin, W.; Goo, C.; Song, C.M.; Han, K.; Kim, S.; Kim, D.-S.; Lee, S.; Oh, Y.
Integrative Machine Learning Approaches for Identifying Loci Associated with Anthracnose Resistance in Strawberry. Plants 2025, 14, 2889.
https://doi.org/10.3390/plants14182889
AMA Style
Jang YJ, Yun D, Shin W, Goo C, Song CM, Han K, Kim S, Kim D-S, Lee S, Oh Y.
Integrative Machine Learning Approaches for Identifying Loci Associated with Anthracnose Resistance in Strawberry. Plants. 2025; 14(18):2889.
https://doi.org/10.3390/plants14182889
Chicago/Turabian Style
Jang, Yoon Jeong, Dabin Yun, Wonyoung Shin, Changrim Goo, Chul Min Song, Koeun Han, Seolah Kim, Do-Sun Kim, Seonghee Lee, and Youngjae Oh.
2025. "Integrative Machine Learning Approaches for Identifying Loci Associated with Anthracnose Resistance in Strawberry" Plants 14, no. 18: 2889.
https://doi.org/10.3390/plants14182889
APA Style
Jang, Y. J., Yun, D., Shin, W., Goo, C., Song, C. M., Han, K., Kim, S., Kim, D.-S., Lee, S., & Oh, Y.
(2025). Integrative Machine Learning Approaches for Identifying Loci Associated with Anthracnose Resistance in Strawberry. Plants, 14(18), 2889.
https://doi.org/10.3390/plants14182889